| Accelerated
Moisture Resistance Unbiased HAST with Pre-conditioning (Note 1)
|
Continuous
storage in 85% Relative Humidity; Non-operating ambient
temperature is 130°C; Pressure is 33 psia; Test duration
is 96 hours.
|
JESD22-A118 Class A |
| Temperature Cycle with Pre-Conditioning (Note 1) |
Alternating hot and cold air; Non-operating temperature extremes are –65°C to +150°C;
Minimum 15 minute dwell time at each temperature extreme;
Test duration is 500 cycles.
|
JESED22-A104-C Test Condition CSoak Mode 4 |
| Operating Life (HTOL)(Note 2) |
Continuous
operation at rated supply voltage; Junction temperature
is 125°C; Test duration is 1000 hours
|
JESD22-A108-C |
| High Temperature Storage |
Continuous
storage in air; Non-operating ambient temperature is 150°C;Test duration is 1000 hours
|
JESD22-A-103-CHigh Temperature Storage Condition B |
| Electrostatic Discharge |
Human Body Model, 2000V minimum |
|
| Electrostatic Discharge |
Machine Model; 200V minimum |
JESD-A-115-A |
| Electrostatic Discharge |
Charge Discharge Model; 200V minimum |
JESD-C-101-C |
| IC Latch-Up |
I-test
and over-voltage latch-up testing for integrated circuits;
Non-operating ambient temperature 25°C and maximum ambient operating temperature |
|
| Solderability |
Eight(8) hour steam age, followed by 5 second
dwell in solder at 245°C; Pb-Free Solder. |
JESD22-B-102-D
Method 1; Pb-Free |
| Physical Dimensions |
Physical Dimensions, including length,
width, and height. Additional measurements may include co-planarity,
pad locations and pad dimensions. |
JESD22-B-100-B |
| Acoustic Micro Imaging |
C-mode Scanning Acoustic Microscope;
Interface and Thru Scans |
J-STD-020-C |